Safwan Wshah
Associate Professor
Department of Computer Science
College of Engineering and Mathematical Sciences
- Gund Affiliate
BIO
Safwan Wshah’s research spans machine learning, deep learning, computer vision, and image and video processing. Prior to joining University of Vermont, Dr. Wshah worked for Xerox and PARC (Palo Alto Research Center)- Xerox company, where he was involved in several projects creating machine learning algorithms for different applications including deep neural networks for counting passengers in HOV/HOT lane vehicles. He also worked on real-time video analytics for a surgical video warning monitor project and in the retail domain with applications such as customer experience time and automated store resource management.
Dr. Wshah holds a PhD in Computer Science and Engineering from State University of New York at Buffalo. He has received ten issued U.S. patents with four additional patents pending. He is the author of three journal publications and 15 conference proceedings. Safwan is a member of the Institute of Electrical and Electronic Engineers (IEEE) and has served on the organizing committee of top conferences and serves as a reviewer/referee for several journals and conferences.
Area(s) of expertise
Machine Learning, Image & Video Processing, Deep Learning, Pattern Recognition, Computer Vision, Document Imaging & Digital Signal Processing
Bio
Safwan Wshah’s research spans machine learning, deep learning, computer vision, and image and video processing. Prior to joining University of Vermont, Dr. Wshah worked for Xerox and PARC (Palo Alto Research Center)- Xerox company, where he was involved in several projects creating machine learning algorithms for different applications including deep neural networks for counting passengers in HOV/HOT lane vehicles. He also worked on real-time video analytics for a surgical video warning monitor project and in the retail domain with applications such as customer experience time and automated store resource management.
Dr. Wshah holds a PhD in Computer Science and Engineering from State University of New York at Buffalo. He has received ten issued U.S. patents with four additional patents pending. He is the author of three journal publications and 15 conference proceedings. Safwan is a member of the Institute of Electrical and Electronic Engineers (IEEE) and has served on the organizing committee of top conferences and serves as a reviewer/referee for several journals and conferences.
Areas of Expertise
Machine Learning, Image & Video Processing, Deep Learning, Pattern Recognition, Computer Vision, Document Imaging & Digital Signal Processing